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dc.contributor.authorBeneš, Oldřich
dc.contributor.authorHampel, David
dc.date.accessioned2022-03-25T01:02:16Z
dc.date.available2022-03-25T01:02:16Z
dc.date.issued2020
dc.identifier.issn1211-8516 Sherpa/RoMEO, JCR
dc.identifier.urihttps://repozitar.mendelu.cz/xmlui/handle/20.500.12698/1533
dc.description.abstractDue to expanding demand for the level of testing on one side and reduction of costs on the other side, the question how to replace expensive destructive testing of medical devices without compromising the quality of final product arising urgently. This situation is common within all highly regulated industries - in this article is addressed the problem from medical device manufacturing industry. Based on real data containing testing and validation datasets, logit model and classification tree model are estimated for establishing the relationship between result of destructive test and measurements of explored device. Results point to possibility of replacing destructive test by non-destructive one in our case.en
dc.format967-972
dc.publisherMendelova univerzita v Brně
dc.relation.ispartofActa Universitatis Agriculturae et Silviculturae Mendelianae Brunensis
dc.relation.urihttps://doi.org/10.11118/actaun202068060967
dc.rightsCC BY-NC-ND 4.0
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectClassification tree modelen
dc.subjectDestructive testen
dc.subjectLogit modelen
dc.subjectMedical devices manufacturingen
dc.subjectNon-destructive testen
dc.titleRationale for Replacement of the Destructive Test by Non-Destructive One in Medical Devices Manufacturingen
dc.typeJ_ČLÁNEK
dc.date.updated2022-03-25T01:02:16Z
dc.description.versionOA
local.identifier.doi10.11118/actaun202068060967
local.identifier.scopus2-s2.0-85097936564
local.number6
local.volume68
local.identifier.obd43920343
local.identifier.e-issn2464-8310
dc.identifier.orcidHampel, David 0000-0002-3865-5948
local.contributor.affiliationPEF


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Zobrazit minimální záznam

CC BY-NC-ND 4.0
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