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Rationale for Replacement of the Destructive Test by Non-Destructive One in Medical Devices Manufacturing 

Beneš, Oldřich; Hampel, David (Mendelova univerzita v Brně, 2020)
Due to expanding demand for the level of testing on one side and reduction of costs on the other side, the question how to replace expensive destructive testing of medical devices without compromising the quality of final ...

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AuthorBeneš, Oldřich (1)
Hampel, David (1)
Subject
Classification tree model (1)
Destructive test (1)Logit model (1)Medical devices manufacturing (1)Non-destructive test (1)... View MoreDate Issued2020 (1)Has File(s)Yes (1)

DSpace software copyright © 2002-2023  DuraSpace
Mendel University in Brno | Library | copyright © 2002-2023  | Send FeedbackBASE
Theme by 
Atmire NV